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Fachzeitschrift für Hochfrequenz- und Mikrowellentechnik

RF & Wireless to measure

RF & Wireless to measure P1 dB of an amplifier the cursors can be moved along the CCDF curve to the probability point where the difference between input and output crest factor is 1 dB, allowing the designer to determine the P1 dB compression characteristics of the amplifier. AR’s PSP series wideband USB pulse power sensors are the instrument of choice for FCC EMC compliance testing of wireless electrical and electronic products called Intentional Radiators that may produce radio frequency pollution (not infrared or ultrasonic energy). In general, radiated emissions are usually associated with unintentional radiators, but intentional radiators can also have unwanted emissions at frequencies outside their intended transmission frequency band. AR’s PSP series wideband USB pulse power sensors and new Figure 3: Test Demo Set-up tribution function (CCDF), as well as the ratio of peak values to the effective value called crest factor (CF). CCDF can give significant insight into the behavior of the power amplifier as it is driven harder into saturation by measuring changes in peak to average ratio (PAR) and crest factor (CF) of the input and output signals simultaneously, while providing a graphical view of the compression of the amplifier in real-time. The Statistical Analysis tool of the PSP Series creates a CCDF graph of the input & output signals and tabular format displaying of cursor readings, average, peak and peak to average power as shown in Figure 5 and Figure 6 respectively. The crest factor can be computed at any percent probability point; so depending on the system requirements and specifications, the user can place the cursor at desired probability point where the crest factor measurement is to be made. Similarly, in order Figure 4: AR’s pulsewARe® Control software for PSP sensors 62 hf-praxis 10/2016

RF & Wireless Figure 5: Amplifier compression – Input CH1 10.25 dB crest factor – yellow trace, Output CH2 9.0 dB crest factor – red trace. Amplifier compression 1.25 dB Figure 6: Tabular format displaying cursor readings, average, peak and peak to average power Solid state pulsed amplifiers are products of choice to perform EMC and RF immunity testing for numerous market applications. The PSP series instruments can precisely measure the pulse shape, characteristics and peak amplitude being produced by the amplifier. Conclusion The USB pulse power sensors are ideal for radiated immunity, telecommunications and intentional radiator EMC testing, as well as applications in manufacturing, design and research. The design of these products allows for fast, accurate and reliable RF power measurements of a wide range of pulsed, modulated and CW signals. Additionally, the PSP series are perfect for precisely measuring the pulse characteristics of AR’s SP-series solid state pulse amplifiers. If you would like to learn more about our new PSP Series Wideband USB pulse power sensors and PulsewARe software, feel free to contact one of our application engineers or visit our website at http://www.arworld.us ◄ News Link Microtek at the European Microwave Week 2016 The EuMW 2016 will be held in London from 3th to 7th October 2016. Bringing industry and academia together, EuMW 2016 is a five day event, including three cutting edge conferences and one exciting trade and technology exhibition featuring leading players from across the globe. EuMW 2016 provides access to the very latest products, research and initiatives in the microwave sector. It also offers you the opportunity for face-to-face interaction with those driving the future of microwave technology. Exhibitor Workshops and Seminars will be provided by several top organisations with superior expertise in Microwave, RF, Wireless or Radar. On stand 180 Link Microtek will be highlighting its in-house capabilities for the design and manufacture of microwave rotating joints for use in radar applications. Also on display will be products from a number of Link’s manufacturing partners around the world. The large rotating joints, which can measure over 1m in length and rotate continuously at up to 60rpm, are complex assemblies incorporating waveguide, multiple coaxial channels and sliprings. They would typically be used in shipborne, air-traffic control or other ground-based long-range radar systems. With decades of experience in this area, Link Microtek’s engineering team in Basingstoke has the necessary expertise to ensure that the company’s rotating joints provide years of reliable service, despite the complexity of the designs and the demanding nature of both their duty cycle and the environments in which they are deployed. Visitors to Stand 180 will also be able to see displays of products from the international manufacturers that Link Microtek represents in the UK and Ireland, including recent additions of high-performance antennas from L-3 Randtron Antenna Systems, high-power microwave components from Ferrite Microwave Technologies, discrete RF/microwave semiconductor devices from Massachusetts Bay Technologies, and millimetre-wave components from HXI. These will be complemented by products from Link’s more established partners, such as active and passive RF and microwave connectorised components from L-3 Narda-MITEQ, frequency and spectrum control components from MtronPTI, high-power broadband microwave vacuum devices from L-3 Electron Devices, and EMF safety monitoring equipment from L-3 Narda Safety Test Solutions. Link Microtek Ltd. www.linkmicrotek.com hf-praxis 10/2016 63

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